Wafer Chip Monitor Inspection Machine Model WBM-2000E
High-quality monitor inspection at optimal magnification is possible with the Takara Leica APO zoom optical system!
This is a visual inspection system for wafer chips that allows operators to reliably identify defective chips while viewing high-quality optical images. It can accurately classify defect locations/categories and image files. The system features an expanding stage that moves in steps, enabling color monitor inspections at optimal magnification suited to chip sizes. For more details, please download and view the catalog.
- Company：アイティ・テック
- Price：Other
